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ORCIDDany Minier
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2020 – today
- 2024
[c10]David C. Keezer
, Dany Minier, Hongjie Li:
Characterization of Ultra-low Random Jitter Reduction Methods up to 36 GHz. ETS 2024: 1-6- [c9]David C. Keezer, Dany Minier:
Multi-Stage Jitter-Reduction and Frequency Multiplication for 54 GHz ATE Clocks. ITC-Asia 2024: 1-6 - 2023
- [c8]David C. Keezer, Dany Minier, Hongjie Li:
Experimental Evaluation of Jitter Reduction Methods for Multi-Gigahertz Test. ITC-Asia 2023: 1-6
2010 – 2019
- 2010
- [j4]David C. Keezer, Carl Gray, Dany Minier, Patrice Ducharme:
Low-Cost 20 Gbps Digital Test Signal Synthesis Using SiGe and InP Logic. J. Electron. Test. 26(1): 87-96 (2010)
2000 – 2009
- 2009
- [c7]David C. Keezer, Carl Gray, A. M. Majid, Dany Minier, Patrice Ducharme:
A development platform and electronic modules for automated test up to 20 Gbps. ITC 2009: 1-11 - 2008
- [j3]David C. Keezer, Dany Minier, Patrice Ducharme, Doris Viens, Greg Flynn, John McKillop:
MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing. VLSI Design 2008: 291686:1-291686:8 (2008) - [c6]David C. Keezer, Dany Minier, Patrice Ducharme:
Variable Delay of Multi-Gigahertz Digital Signals for Deskew and Jitter-Injection Test Applications. DATE 2008: 1486-1491 - [c5]David C. Keezer, Dany Minier, Patrice Ducharme, A. M. Majid:
An Electronic Module for 12.8 Gbps Multiplexing and Loopback Test. ITC 2008: 1-9 - 2007
- [c4]David C. Keezer, Dany Minier, Patrice Ducharme:
Method for reducing jitter in multi-gigahertz ATE. DATE 2007: 701-706 - [c3]David C. Keezer, Dany Minier, Patrice Ducharme, Doris Viens, Greg Flynn, John McKillop:
Multi-GHz loopback testing using MEMs switches and SiGe logic. ITC 2007: 1-10 - 2006
- [j2]David C. Keezer, Dany Minier, Patrice Ducharme:
Source-Synchronous Testing of Multilane PCI Express and HyperTransport Buses. IEEE Des. Test Comput. 23(1): 46-57 (2006) - 2004
- [j1]David C. Keezer, Dany Minier, Marie-Christine Caron:
Multiplexing ATE Channels for Production Testing at 2.5 Gbps. IEEE Des. Test Comput. 21(4): 288-301 (2004) - [c2]David C. Keezer, Dany Minier, F. Binette:
Modular Extension of ATE to 5 Gbps. ITC 2004: 748-757 - 2003
- [c1]David C. Keezer, Dany Minier, Marie-Christine Caron:
A Production-Oriented Multiplexing System for Testing above 2.5 Gbps. ITC 2003: 191-200
Coauthor Index
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