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ORCIDFranz-Josef Niedernostheide
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2010 – 2019
- 2018
[j7]Roman Baburske, Franz-Josef Niedernostheide, Hans-Joachim Schulze, Riteshkumar Bhojani, J. Kowalsky, Josef Lutz
:
Unified view on energy and electrical failure of the short-circuit operation of IGBTs. Microelectron. Reliab. 88-90: 236-241 (2018)- 2014
- [j6]Thomas Basler, M. Pfaffenlehner, Hans Peter Felsl, Franz-Josef Niedernostheide, F. Pfirsch, Hans-Joachim Schulze, Roman Baburske, Josef Lutz:
Switching ruggedness and surge-current capability of diodes using the self-adjusting p emitter efficiency diode concept. IET Circuits Devices Syst. 8(3): 205-212 (2014)
2000 – 2009
- 2008
- [j5]S. Milady, D. Silber, Franz-Josef Niedernostheide, Hans Peter Felsl:
Different types of avalanche-induced moving current filaments under the influence of doping inhomogeneities. Microelectron. J. 39(6): 857-867 (2008) - 2007
- [j4]Franz-Josef Niedernostheide, Hans-Joachim Schulze, Hans Peter Felsl, Thomas Laska, Ulrich Kellner-Werdehausen, Josef Lutz:
Thyristors and IGBTs with integrated self-protection functions. IET Circuits Devices Syst. 1(5): 315-320 (2007) - 2006
- [j3]Ralf Siemieniec, Hans-Joachim Schulze, Franz-Josef Niedernostheide, W. Südkamp, Josef Lutz:
Compensation and doping effects in heavily helium-radiated silicon for power device applications. Microelectron. J. 37(3): 204-212 (2006) - 2001
- [j2]Mathias Bode, O. Freyd, Joern Fischer, Franz-Josef Niedernostheide, Hans-Joachim Schulze:
Hybrid hardware for a highly parallel search in the context of learning classifiers. Artif. Intell. 130(1): 75-84 (2001) - [j1]M. Zmeck, J. C. H. Phang, Andrew Bettiol, T. Osipowicz, F. Watt, L. J. Balk, Franz-Josef Niedernostheide, Hans-Joachim Schulze, E. Falck, R. Barthelmess:
Analysis of high-power devices using proton beam induced charge microscopy. Microelectron. Reliab. 41(9-10): 1519-1524 (2001)
Coauthor Index
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