default search action

combined dblp search
author search
venue search
publication search

ask others

Y. X. Seah

> Home > Persons

Person information

Refine list

refinements active!

zoomed in on ?? of ?? records

view refined list in

export refined list as

showing all ?? records

2000 – 2009

see FAQ

What is the meaning of the colors in the publication lists?

2003
[j1]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/PhangCOKCPGS03
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/PhangCOKCPGS03
J. C. H. Phang, D. S. H. Chan, V. K. S. Ong, S. Kolachina, J. M. Chin, M. Palaniappan, G. Gilfeather, Y. X. Seah:
Single contact beam induced current phenomenon for microelectronic failure analysis. Microelectron. Reliab. 43(9-11): 1595-1602 (2003)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.