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Markus Ackermann 0002

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affiliation: X-FAB Semiconductor Foundries AG, Erfurt, Germany

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2010 – 2019

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2014
[j5]
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Jörg Kludt, Kirsten Weide-Zaage, Markus Ackermann, Verena Hein, Christian Kovács:
Degradation behavior in upstream/downstream via test structures. Microelectron. Reliab. 54(9-10): 1724-1728 (2014)
2013
[j4]
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Aymen Moujbani, Jörg Kludt, Kirsten Weide-Zaage, Markus Ackermann, Verena Hein, Lutz Meinshausen:
Dynamic simulation of migration induced failure mechanism in integrated circuit interconnects. Microelectron. Reliab. 53(9-11): 1365-1369 (2013)
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Jörg Kludt, Kirsten Weide-Zaage, Markus Ackermann, Verena Hein:
Dynamic simulation of octahedron slotted metal structures. Microelectron. Reliab. 53(9-11): 1606-1610 (2013)
2012
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Jörg Kludt, Kirsten Weide-Zaage, Markus Ackermann, Verena Hein:
Simulation of the influence of TiAl₃ layers on the thermal-electrical and mechanical behaviour of Al metallizations. Microelectron. Reliab. 52(9-10): 1987-1992 (2012)
[j1]
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Markus Ackermann, Verena Hein, Christian Kovács, Kirsten Weide-Zaage:
A design for robust wide metal tracks. Microelectron. Reliab. 52(9-10): 2447-2451 (2012)

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