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2020 – today
- 2020
[j5]Álvaro Gómez-Pau
, Emili Lupon, Luz Balado, Joan Figueras:
Indirect and adaptive test of analogue circuits based on preselected steady-state response measures. IET Circuits Devices Syst. 14(5): 611-618 (2020)
2010 – 2019
- 2019
- [j4]Michael Weiner, Wolfgang Wieser, Emili Lupon, Georg Sigl, Salvador Manich:
A Calibratable Detector for Invasive Attacks. IEEE Trans. Very Large Scale Integr. Syst. 27(5): 1067-1079 (2019) - 2015
- [j3]Sergio Busquets-Monge, Ramkrishan Maheshwari, Joan Nicolas-Apruzzese, Emili Lupon, Stig Munk-Nielsen, Josep Bordonau:
Enhanced DC-Link Capacitor Voltage Balancing Control of DC-AC Multilevel Multileg Converters. IEEE Trans. Ind. Electron. 62(5): 2663-2672 (2015) - 2014
- [j2]Emili Lupon, Sergio Busquets-Monge, Joan Nicolas-Apruzzese:
FPGA Implementation of a PWM for a Three-Phase DC-AC Multilevel Active-Clamped Converter. IEEE Trans. Ind. Informatics 10(2): 1296-1306 (2014)
2000 – 2009
- 2009
- [j1]Luz Balado, Emili Lupon, Joan Figueras, Miquel Roca, Eugeni Isern, Rodrigo Picos:
Verifying Functional Specifications by Regression Techniques on Lissajous Test Signatures. IEEE Trans. Circuits Syst. I Regul. Pap. 56-I(4): 754-762 (2009) - 2006
- [c4]Luz Balado, Emili Lupon, L. García, Rosa Rodríguez-Montañés, Joan Figueras:
Lissajous Based Mixed-Signal Testing for N-Observable Signals. DDECS 2006: 125-130 - 2004
- [c3]Marie-Lise Flottes, Yves Bertrand, Luz Balado, Emili Lupon, Anton Biasizzo, Franc Novak, Stefano Di Carlo, Paolo Prinetto, Nicoleta Pricopi, Hans-Joachim Wunderlich:
Digital, Memory and Mixed-Signal Test Engineering Education: Five Centres of Competence in Europ. DELTA 2004: 135-139 - [c2]Salvador Manich, L. García, Luz Balado, Emili Lupon, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras:
BIST Technique by Equally Spaced Test Vector Sequences. VTS 2004: 206-216 - 2003
- [c1]Salvador Manich, L. García, Luz Balado, Emili Lupon, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras:
On the selection of efficient arithmetic additive test pattern generators [logic test]. ETW 2003: 9-14
Coauthor Index
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