default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDYinghua Min
Person information
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2010 – 2019
- 2011
[j23]Ying Zhang, Huawei Li, Yinghua Min, Xiaowei Li:
Selected Transition Time Adjustment for Tolerating Crosstalk Effects on Network-on-Chip Interconnects. IEEE Trans. Very Large Scale Integr. Syst. 19(10): 1787-1800 (2011)- 2010
- [j22]Ruilian Zhao, Michael R. Lyu, Yinghua Min:
Automatic string test data generation for detecting domain errors. Softw. Test. Verification Reliab. 20(3): 209-236 (2010)
2000 – 2009
- 2009
- [c32]Jie Wang, Huawei Li
, Yinghua Min, Xiaowei Li, Huaguo Liang:
Impact of Hazards on Pattern Selection for Small Delay Defects. PRDC 2009: 49-54 - 2008
- [c31]Guangxing Zhang, Gaogang Xie, Jianhua Yang, Yinghua Min, Zhaomin Zhou, Xiaodong Duan:
Accurate Online Traffic Classification with Multi-Phases Identification Methodology. CCNC 2008: 141-146 - 2007
- [c30]Jacob Abraham, Salvador Mir, Yinghua Min, Jeremy Wang, Cheng-Wen Wu:
Test Education in the Global Economy. ATS 2007: 53 - [c29]Kun Xie, Yinghua Min, Dafang Zhang, Jigang Wen, Gaogang Xie:
A Scalable Bloom Filter for Membership Queries. GLOBECOM 2007: 543-547 - [c28]Gaogang Xie, Guangxing Zhang, Jianhua Yang, Yinghua Min, Valérie Issarny, Alberto Conte:
Survey on Traffic of Metro Area Network with Measurement On-Line. ITC 2007: 666-677 - 2005
- [j21]Jie Wu, Feng Gao, Zhongcheng Li, Yinghua Min:
Optimal, and reliable communication in hypercubes using extended safety vectors. IEEE Trans. Reliab. 54(3): 402-411 (2005) - [c27]Yuan-sheng Luo, Dafang Zhang, Yinghua Min:
An Improved Scheme of Index-Based Checkpointing. PRDC 2005: 167-174 - 2004
- [j20]Debesh K. Das, Hideo Fujiwara, Yungang Li, Yinghua Min, Shiyi Xu, Yervant Zorian:
Design & Test Education in Asia. IEEE Des. Test Comput. 21(4): 331-338 (2004) - 2003
- [j19]Jianhui Jiang, Yinghua Min, Chenglian Peng:
Fault-Tolerant Systems with Concurrent Error-Locating Capability. J. Comput. Sci. Technol. 18(2): 190-200 (2003) - [j18]Jishun Kuang, Zhiqiang Yang, Qijian Zhu, Yinghua Min:
IDDT: Fundamentals and Test Generation. J. Comput. Sci. Technol. 18(3): 299-307 (2003) - [j17]Zhigang Yin, Yinghua Min, Xiaowei Li, Huawei Li:
A Novel RT-Level Behavioral Description Based ATPG Method. J. Comput. Sci. Technol. 18(3): 308-317 (2003) - [c26]Ruilian Zhao, Michael R. Lyu, Yinghua Min:
Domain Testing Based on Character String Predicate. Asian Test Symposium 2003: 96-101 - [c25]Yinghua Min, Jishun Kuang, Xiaoyan Niu:
At-Speed Current Testing. Asian Test Symposium 2003: 396-399 - [c24]Ruilian Zhao, Michael R. Lyu, Yinghua Min:
A New Software Testing Approach Based on Domain Analysis of Specifications and Programs. ISSRE 2003: 60-70 - 2002
- [j16]Zuying Luo, Yinghua Min, Shiyuan Yang, Xiaowei Li:
The monotonic increasing relationship between average powers of CMOS VLSI circuits with and without delay and its applications. Sci. China Ser. F Inf. Sci. 45(6): 401-415 (2002) - [j15]Huawei Li, Yinghua Min, Zhongcheng Li:
Clustering of behavioral phases in FSMs and its applications to VLSI test. Sci. China Ser. F Inf. Sci. 45(6): 462-478 (2002) - [j14]Yinghua Min:
Why RTL ATPG? J. Comput. Sci. Technol. 17(2): 113-117 (2002) - [c23]Zuying Luo, Xiaowei Li, Huawei Li, Shiyuan Yang, Yinghua Min:
Test Power Optimization Techniques for CMOS Circuits. Asian Test Symposium 2002: 332-337 - 2001
- [j13]Dafang Zhang, Gaogang Xie, Yinghua Min:
Node Grouping in System-Level Fault Diagnosis. J. Comput. Sci. Technol. 16(5): 474-479 (2001) - [c22]Huawei Li, Yinghua Min, Zhongcheng Li:
An RT-Level ATPG Based on Clustering of Circuit States. Asian Test Symposium 2001: 213-218 - [c21]Zhigang Yin, Yinghua Min, Xiaowei Li:
An Approach to RTL Fault Extraction and Test Generation. Asian Test Symposium 2001: 219-224 - [c20]Xiaowei Li, Huawei Li, Yinghua Min:
Reducing Power Dissipation during At-Speed Test Application. DFT 2001: 116- - 2000
- [j12]Huawei Li, Zhongcheng Li, Yinghua Min:
Reduction of Number of Paths to be Tested in Delay Testing. J. Electron. Test. 16(5): 477-485 (2000) - [c19]Lijian Li, Xiaoyang Yu, Cheng-Wen Wu, Yinghua Min:
A waveform simulator based on Boolean process. Asian Test Symposium 2000: 145-150 - [c18]Lijian Li, Yinghua Min:
An efficient BIST design using LFSR-ROM architecture. Asian Test Symposium 2000: 386- - [c17]Jie Wu, Feng Gao, Zhongcheng Li, Yinghua Min:
Optimal Fault-Tolerant Routing in Hypercubes Using Extended Safety Vectors. ICPADS 2000: 264-271
1990 – 1999
- 1999
- [j11]Yinghua Min, Zhongcheng Li:
An analytical delay model. J. Comput. Sci. Technol. 14(2): 97-115 (1999) - [c16]Jianhui Jiang, Hongbao Shi, Yinghua Min, Xiaodong Zhao:
A Novel NMR Structure with Concurrent Error Location Capabilities. PRDC 1999: 32-39 - 1998
- [j10]Yinghua Min, Zhongcheng Li:
IDDT Testing versus IDDQ Testing. J. Electron. Test. 13(1): 51-55 (1998) - [j9]Yingquan Zhou, Mike W. T. Wong, Yinghua Min:
On concurrent multiple error diagnosability in linear analog circuits using continuous checksum. Int. J. Circuit Theory Appl. 26(1): 53-64 (1998) - [c15]Zhongcheng Li, Yinghua Min, Robert K. Brayton:
A New Low-Cost Method for Identifying Untestable Path Delay Faults. Asian Test Symposium 1998: 76-81 - [c14]Huawei Li, Zhongcheng Li, Yinghua Min:
Delay Testing with Double Observations. Asian Test Symposium 1998: 96- - 1997
- [j8]Zhuxing Zhao, Yinghua Min, Zhongcheng Li:
Path sensitization. J. Comput. Sci. Technol. 12(3): 271-282 (1997) - [j7]Wangning Long, Yinghua Min, Shiyuan Yang, Shibai Tong:
Short-time scaling of variable ordering of OBDDs. J. Comput. Sci. Technol. 12(4): 366-371 (1997) - [c13]Wangning Long, Shiyuan Yang, Zhongcheng Li, Yinghua Min:
Memory Efficient ATPG for Path Delay Faults. Asian Test Symposium 1997: 326-331 - [c12]Xiaoming Yu, Yinghua Min:
Design of delay-verifiable combinational logic by adding extra inputs. Asian Test Symposium 1997: 332- - [c11]Yinghua Min, Zhuxing Zhao, Zhongcheng Li:
IDDT Testing. Asian Test Symposium 1997: 378-383 - [c10]Zhongcheng Li, Yuhong Zhao, Yinghua Min, Robert K. Brayton:
Timed Binary Decision Diagrams. ICCD 1997: 352-357 - [c9]Zhongcheng Li, Robert K. Brayton, Yinghua Min:
Efficient Identification of Non-Robustly Untestable Path Delay Faults. ITC 1997: 992-997 - 1996
- [j6]Yingquan Zhou, Mike W. T. Wong, Yinghua Min:
Hardware reduction in continuous checksum-based analog checkers: Algorithm and its analysis. J. Electron. Test. 9(1-2): 153-163 (1996) - [j5]Yingquan Zhou, Yinghua Min:
A kind of Multistage Interconnection Networks with multiple paths. J. Comput. Sci. Technol. 11(4): 395-404 (1996) - [c8]Zhuxing Zhao, Zhongcheng Li, Yinghua Min:
Waveform Polynomial Manipulation Using Bdds. Asian Test Symposium 1996: 136-141 - [c7]Yinghua Min, Zhuxing Zhao, Zhongcheng Li:
An Analytical Delay Model Based on Boolean Process. VLSI Design 1996: 162-165 - 1995
- [j4]Youli Min, Yinghua Min:
A fault-tolerant and heuristic routing algorithm for faulty hypercubes. J. Comput. Sci. Technol. 10(6): 536-544 (1995) - [c6]Yinghua Min, Zhuxing Zhao, Zhongcheng Li:
Boolean process-an analytical approach to circuit representation (II). Asian Test Symposium 1995: 26-32 - [c5]Vishwani D. Agrawal, Bernard Courtois, Fumiyasu Hirose, Sandip Kundu, Chung-Len Lee, Yinghua Min, Parimal Pal Chaudhuri:
Panel: New Research Problems in the Emerging Test Technology. Asian Test Symposium 1995: 189-190 - [c4]Yingquan Zhou, Mike W. T. Wong, Yinghua Min:
Feasibility and Effectiveness of the Algorithm for Overhead Reduction in Analog Checkers. FTCS 1995: 238-247 - 1994
- [c3]Yinghua Min, Yutang Zhou, Zhongcheng Li, Cheng Ye, Yuqi Pan:
Behavioral Design and Prototyping of a Fail-Safe System. VLSI Design 1994: 159-162 - 1993
- [c2]Yinghua Min, Zhongcheng Li:
Evaluation of test generation algorithms. VTS 1993: 348-350 - 1991
- [j3]Yinghua Min, Yashwant K. Malaiya, Boping Jin:
Analysis of Detection Capability of Parallel Signature Analyzers. IEEE Trans. Computers 40(9): 1075-1081 (1991)
1980 – 1989
- 1988
- [j2]Yinghua Min, Jintao Li:
Strongly fault secure PLAs and totally self-checking checkers. IEEE Trans. Computers 37(6): 863-867 (1988) - 1986
- [j1]Yinghua Min, Zhongcheng Li:
Pseudo-Exhaustive Testing Strategy for Large Combinational Circuits. Comput. Syst. Sci. Eng. 1(4): 213-220 (1986) - 1982
- [c1]Yinghua Min, Stephen Y. H. Su:
Testing functional faults in VLSI. DAC 1982: 384-392
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-09-19 23:43 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
