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Lung-Jen Lee
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2010 – 2019
- 2019
- [c7]Hsiao-Hsuan Cheng, Chiung-An Chen, Lung-Jen Lee, Ting-Lan Lin, Yih-Shyh Chiou, Shih-Lun Chen:
A Low-Complexity Color Image Compression Algorithm Based on AMBTC. ICCE-TW 2019: 1-2 - 2013
- [j5]Lung-Jen Lee:
Observation-Oriented ATPG and Scan Chain Disabling for Capture Power Reduction. J. Electron. Test. 29(5): 625-634 (2013) - 2012
- [j4]Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin, Cheng-Ho Chang:
$2^{n}$ Pattern Run-Length for Test Data Compression. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(4): 644-648 (2012) - [c6]Lung-Jen Lee, Chia-Cheng He, Wang-Dauh Tseng:
Deterministic ATPG for Low Capture Power Testing. MTV 2012: 24-29 - [c5]Lung-Jen Lee, Wang-Dauh Tseng, Wen-Ting Yang:
Dual-LFSR Reseeding for Low Power Testing. MTV 2012: 30-34 - [c4]Lung-Jen Lee, Wang-Dauh Tseng, Wei-Shun Chen:
Two-Way Multicasting for Test Data Compression. MTV 2012: 60-64 - 2010
- [j3]Wang-Dauh Tseng, Lung-Jen Lee:
Test Data Compression Using Multi-dimensional Pattern Run-length Codes. J. Electron. Test. 26(3): 393-400 (2010) - [j2]Wang-Dauh Tseng, Lung-Jen Lee, Rung-Bin Lin:
Deterministic built-in self-test using multiple linear feedback shift registers for test power and test volume reduction. IET Comput. Digit. Tech. 4(4): 317-324 (2010)
2000 – 2009
- 2009
- [c3]Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin, Chi-Wei Yu:
Deterministic Built-In Self-Test Using Multiple Linear Feedback Shift Registers for Low-Power Scan Testing. Asian Test Symposium 2009: 111-116 - [c2]Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin, Chen-Lun Lee:
A Multi-dimensional Pattern Run-Length Method for Test Data Compression. Asian Test Symposium 2009: 325-330 - 2008
- [j1]Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin:
Power Reduction during Scan Testing Based on Multiple Capture Technique. IEICE Trans. Electron. 91-C(5): 798-805 (2008) - 2007
- [c1]Wang-Dauh Tseng, Lung-Jen Lee:
Reduction of Power Dissipation during Scan Testing by Test Vector Ordering. MTV 2007: 15-21
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