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2020 – today
- 2024
[c12]Soumitra Joy, Kaustubh Joshi, Ahmad Zubair, Samuel Bader, Jason Peck, Michael Beumer, Pratik Koirala, Marko Radosavljevic, Heli Vora, Inanc Meric, Han Wui Then:
PBTI in Scaled Oxide Submicron Enhancement Mode High-K Gallium Nitride Transistors. IRPS 2024: 6- 2023
- [c11]M. Jamil, S. Mukhopadhay, M. Ghoneim, A. Shailos, Chetan Prasad, Inanc Meric, Stephen Ramey:
Reliability Studies on Advanced FinFET Transistors of the Intel 4 CMOS Technology. IRPS 2023: 1-5 - [c10]K. Joshi, D. Nminibapiel, M. Ghoneim, D. Ali, R. Ramamurthy, L. Pantisano, Inanc Meric, Stephen Ramey:
A detailed comparison of various off-state breakdown methodologies for scaled Tri-gate technologies. IRPS 2023: 1-6 - [c9]Colin Landon, Lei Jiang, Daniel Pantuso, Inanc Meric, Kam Komeyli, Jeffrey Hicks, Daniel Schroeder:
Localized thermal effects in Gate-all-around devices. IRPS 2023: 1-5 - [c8]S. Mukhopadhyay, C. Chen, M. Jamil, Jihan Standfest, Inanc Meric, Balkaran Gill, Stephen Ramey:
A Unified Aging Model Framework Capturing Device to Circuit Degradation for Advance Technology Nodes. IRPS 2023: 1-4 - [c7]Mauro J. Kobrinsky, J. D. Silva, E. Mannebach, S. Mills, M. Abd El Qader, O. Adebayo, N. Arkali Radhakrishna, M. Beasley, J. Chawla, S. Chugh, A. Dasgupta, U. Desai, E. De Re, G. Dewey, T. Edwards, C. Engel, V. Gudmundsson, Jeffery Hicks, B. Krist, R. Mehandru, Inanc Meric, Patrick Morrow, D. Nandi, P. Patel, R. Ramamurthy, D. Samanta, L. Shoer, A. St Amour, L. H. Tan, Sukru Yemenicioglu, X. Wang, T. Ghani:
Novel Cell Architectures with Back-side Transistor Contacts for Scaling and Performance. VLSI Technology and Circuits 2023: 1-2 - 2022
- [c6]D. Nminibapiel, K. Joshi, R. Ramamurthy, L. Pantisano, Inanc Meric, Stephen Ramey:
Method to evaluate off-state breakdown in scaled Tri-gate technologies. IRPS 2022: 1-6 - 2021
- [c5]Neel Chatterjee, John Ortega, Inanc Meric, Peng Xiao, Ilan Tsameret:
Machine Learning On Transistor Aging Data: Test Time Reduction and Modeling for Novel Devices. IRPS 2021: 1-9 - 2020
- [c4]Inanc Meric, Stephen Ramey, Steven R. Novak, S. Gupta, S. P. Mudanai, Jeffrey Hicks:
Modeling Framework for Transistor Aging Playback in Advanced Technology Nodes. IRPS 2020: 1-6 - [c3]Ketul B. Sutaria, Jihan Standfest, Inanc Meric, Amirhossein H. Davoody, Swaroop Kumar Namalapuri, Trinadh Mutyala, Supriya P., Balkaran Gill, Stephen Ramey, Jeffery Hicks:
Novel Re-configurable Circuits For Aging Characterization: Connecting Devices to Circuits. IRPS 2020: 1-5
2010 – 2019
- 2018
- [c2]Chen-Yi Su, M. Armstrong, Lei Jiang, S. A. Kumar, C. D. Landon, S. Liu, Inanc Meric, K. W. Park, Leif Paulson, K. Phoa, Bernhard Sell, Jihan Standfest, Ketul B. Sutaria, J. Wan, D. Young, Stephen Ramey:
Transistor reliability characterization and modeling of the 22FFL FinFET technology. IRPS 2018: 6 - 2013
- [j1]Inanc Meric, Cory R. Dean, Nicholas Petrone
, Lei Wang, James C. Hone, Philip Kim, Kenneth L. Shepard:
Graphene Field-Effect Transistors Based on Boron-Nitride Dielectrics. Proc. IEEE 101(7): 1609-1619 (2013)
2000 – 2009
- 2008
- [c1]Kenneth L. Shepard, Inanc Meric, Philip Kim:
Characterization and modeling of graphene field-effect devices. ICCAD 2008: 406-411
Coauthor Index
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