"Bug localization techniques for effective post-silicon validation."

Subhasish Mitra et al. (2012)

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DOI: 10.1109/ASPDAC.2012.6164961

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Subhasish Mitra, David Lin, Nagib Hakim, Donald S. Gardner:
Bug localization techniques for effective post-silicon validation. ASP-DAC 2012: 291

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