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"A State Reduction Method for Non-Scan Based FSM Testing with Don't Care ..."

Toshinori Hosokawa, Hiroshi Date, Michiaki Muraoka (2002)

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DOI: 10.1109/ATS.2002.1181685

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Toshinori Hosokawa, Hiroshi Date, Michiaki Muraoka:
A State Reduction Method for Non-Scan Based FSM Testing with Don't Care Inputs Identification Technique. Asian Test Symposium 2002: 55-60

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