"Extended Selective Encoding of Scan Slices for Reducing Test Data and Test ..."

Jun Liu, Yinhe Han, Xiaowei Li (2009)

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DOI: 10.1109/ATS.2009.63

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-23

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Jun Liu, Yinhe Han, Xiaowei Li:
Extended Selective Encoding of Scan Slices for Reducing Test Data and Test Power. Asian Test Symposium 2009: 319-324

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