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"Test Pattern and Test Configuration Generation Methodology for the Logic ..."

Michel Renovell et al. (1997)

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DOI: 10.1109/ATS.1997.643967

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/ats/RenovellPFZ97
Michel Renovell, Jean-Michel Portal, Joan Figueras, Yervant Zorian:
Test Pattern and Test Configuration Generation Methodology for the Logic of RAM-Based FPGA. Asian Test Symposium 1997: 254-

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