"Contest: A Concurrent Test Generator for Sequential Circuits."

Vishwani D. Agrawal, Kwang-Ting Cheng, Prathima Agrawal (1988)

Details and statistics

DOI:

access: closed

type: Conference or Workshop Paper

metadata version: 2017-03-16

a service of  Schloss Dagstuhl - Leibniz Center for Informatics