"DFM/DFY design for manufacturability and yield - influence of process ..."

Markus Bühler et al. (2006)

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DOI: 10.1109/DATE.2006.243763

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Markus Bühler, Jürgen Koehl, Jeanne Bickford, Jason Hibbeler, Ulf Schlichtmann, Ralf Sommer, Michael Pronath, Andreas Ripp:
DFM/DFY design for manufacturability and yield - influence of process variations in digital, analog and mixed-signal circuit design. DATE 2006: 387-392

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