"Multi-temperature testing for core-based system-on-chip."

Zhiyuan He, Zebo Peng, Petru Eles (2010)

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DOI: 10.1109/DATE.2010.5457209

access: closed

type: Conference or Workshop Paper

metadata version: 2022-08-09

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Zhiyuan He, Zebo Peng, Petru Eles:
Multi-temperature testing for core-based system-on-chip. DATE 2010: 208-213

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