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"MVP ECC : Manufacturing process variation aware unequal protection ECC for ..."

Seung-Yeob Lee, Joon-Sung Yang (2017)

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DOI: 10.23919/DATE.2017.7927105

access: closed

type: Conference or Workshop Paper

metadata version: 2017-08-14

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  dblp key:
  - conf/date/LeeY17
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  persistent URL:
  - https://dblp.org/rec/conf/date/LeeY17
Seung-Yeob Lee, Joon-Sung Yang:
MVP ECC : Manufacturing process variation aware unequal protection ECC for memory reliability. DATE 2017: 846-851

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