"MVP ECC : Manufacturing process variation aware unequal protection ECC for ..."

Seung-Yeob Lee, Joon-Sung Yang (2017)

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DOI: 10.23919/DATE.2017.7927105

access: closed

type: Conference or Workshop Paper

metadata version: 2017-08-14

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Seung-Yeob Lee, Joon-Sung Yang:
MVP ECC : Manufacturing process variation aware unequal protection ECC for memory reliability. DATE 2017: 846-851

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