"Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI."

M. Saliva et al. (2015)

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type: Conference or Workshop Paper

metadata version: 2021-08-09

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M. Saliva, Florian Cacho, Vincent Huard, X. Federspiel, D. Angot, Ahmed Benhassain, Alain Bravaix, Lorena Anghel:
Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI. DATE 2015: 441-446

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