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"Valid Window: A New Metric to Measure the Reliability of NAND Flash Memory."
Min Ye et al. (2020)
- Min Ye
, Qiao Li
, Jianqiang Nie, Tei-Wei Kuo
, Chun Jason Xue:
Valid Window: A New Metric to Measure the Reliability of NAND Flash Memory. DATE 2020: 109-114
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