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"Valid Window: A New Metric to Measure the Reliability of NAND Flash Memory."

Min Ye et al. (2020)

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DOI: 10.23919/DATE48585.2020.9116337

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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  dblp key:
  - conf/date/Ye0NKX20
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  - https://dblp.org/rec/conf/date/Ye0NKX20
Min Ye, Qiao Li, Jianqiang Nie, Tei-Wei Kuo, Chun Jason Xue:
Valid Window: A New Metric to Measure the Reliability of NAND Flash Memory. DATE 2020: 109-114

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