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"Response Compaction for Test Time and Test Pins Reduction Based on ..."

Yinhe Han et al. (2004)

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DOI: 10.1109/DFT.2004.54

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-23

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Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li, Anshuman Chandra:
Response Compaction for Test Time and Test Pins Reduction Based on Advanced Convolutional Codes. DFT 2004: 298-305

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