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"A BIST approach for counterfeit circuit detection based on NBTI degradation."

Puneet Ramesh Savanur, Phaninder Alladi, Spyros Tragoudas (2015)

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DOI: 10.1109/DFT.2015.7315148

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/dft/SavanurAT15
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  persistent URL:
  - https://dblp.org/rec/conf/dft/SavanurAT15
Puneet Ramesh Savanur, Phaninder Alladi, Spyros Tragoudas:
A BIST approach for counterfeit circuit detection based on NBTI degradation. DFTS 2015: 123-126

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