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"Data invalidation analysis for scan-based debug on multiple-clock system ..."

Sandeep Kumar Goel, Bart Vermeulen (2002)

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DOI: 10.1109/ETW.2002.1029640

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-28

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Sandeep Kumar Goel, Bart Vermeulen:
Data invalidation analysis for scan-based debug on multiple-clock system chips. ETW 2002: 61-66

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