"Loss is Gain: Shortening Data for Lifetime Improvement on Low-Cost ECC ..."

Yejia Di et al. (2018)

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DOI: 10.1145/3194554.3194571

access: closed

type: Conference or Workshop Paper

metadata version: 2025-04-14

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Yejia Di, Liang Shi, Congming Gao, Qiao Li, Kaijie Wu, Chun Jason Xue:
Loss is Gain: Shortening Data for Lifetime Improvement on Low-Cost ECC Enabled Consumer-Level Flash Memory. ACM Great Lakes Symposium on VLSI 2018: 225-230

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