"A tool flow for predicting system level timing failures due to ..."

Jin Guo et al. (2008)

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DOI: 10.1145/1366110.1366180

access: closed

type: Conference or Workshop Paper

metadata version: 2019-09-04

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Jin Guo, Antonis Papanikolaou, Michele Stucchi, Kristof Croes, Zsolt Tokei, Francky Catthoor:
A tool flow for predicting system level timing failures due to interconnect reliability degradation. ACM Great Lakes Symposium on VLSI 2008: 291-296

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