"Automatic test pattern generation for delay defects using timed ..."

Shin-Yann Ho et al. (2013)

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DOI: 10.1109/ICCAD.2013.6691103

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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  - https://dblp.org/rec/conf/iccad/HoLYKLJL13
Shin-Yann Ho, Shuo-Ren Lin, Ko-Lung Yuan, Chien-Yen Kuo, Kuan-Yu Liao, Jie-Hong R. Jiang, Chien-Mo James Li:
Automatic test pattern generation for delay defects using timed characteristic functions. ICCAD 2013: 91-98

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