"Dealing with IC manufacturability in extreme scaling (Embedded tutorial ..."

Bei Yu et al. (2012)

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DOI: 10.1145/2429384.2429430

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-09

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  - https://dblp.org/rec/conf/iccad/YuGDBYYCP12
Bei Yu, Jhih-Rong Gao, Duo Ding, Yongchan Ban, Jae-Seok Yang, Kun Yuan, Minsik Cho, David Z. Pan:
Dealing with IC manufacturability in extreme scaling (Embedded tutorial paper). ICCAD 2012: 240-242

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