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"Gate Voltages Impacting on Latch-up Measurements."

Shao-Chang Huang et al. (2022)

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DOI: 10.1109/ICCE-TAIWAN55306.2022.9869282

access: closed

type: Conference or Workshop Paper

metadata version: 2022-12-07

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  dblp key:
  - conf/icce-tw/HuangLCLLHLCWLJ22
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  - https://dblp.org/rec/conf/icce-tw/HuangLCLLHLCWLJ22
Shao-Chang Huang, Jian-Hsing Lee, Chun-Chih Chen, Ching-Ho Li, Chih-Cherng Liao, Kai-Chieh Hsu, Gong-Kai Lin, Li-Fan Chen, Chien-Wei Wang, Chih-Hsuan Lin, Yeh-Ning Jou, Ke-Horng Chen:
Gate Voltages Impacting on Latch-up Measurements. ICCE-TW 2022: 75-76

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