"On the efficiency of test suite based program repair: A Systematic ..."

Kui Liu et al. (2020)

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DOI: 10.1145/3377811.3380338

access: closed

type: Conference or Workshop Paper

metadata version: 2025-03-03

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  - https://dblp.org/rec/conf/icse/0001WKKB0WKMT20
Kui Liu, Shangwen Wang, Anil Koyuncu, Kisub Kim, Tegawendé F. Bissyandé, Dongsun Kim, Peng Wu, Jacques Klein, Xiaoguang Mao, Yves Le Traon:
On the efficiency of test suite based program repair: A Systematic Assessment of 16 Automated Repair Systems for Java Programs. ICSE 2020: 615-627

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