"Measuring and Improving Latency to Avoid Test Suite Wear Out."

Shin Yoo, Mark Harman, Shmuel Ur (2009)

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DOI: 10.1109/ICSTW.2009.10

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Shin Yoo, Mark Harman, Shmuel Ur:
Measuring and Improving Latency to Avoid Test Suite Wear Out. ICST Workshops 2009: 101-110

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