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"Nonlinear Mixed Model and Reliability Prediction for OLED Luminance ..."

Kanghyun Choi, Jongwon Lee, Jongwoo Park (2019)

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DOI: 10.1109/IRPS.2019.8720437

access: closed

type: Conference or Workshop Paper

metadata version: 2024-03-04

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  dblp key:
  - conf/irps/ChoiLP19
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Kanghyun Choi, Jongwon Lee, Jongwoo Park:
Nonlinear Mixed Model and Reliability Prediction for OLED Luminance Degradation. IRPS 2019: 1-4

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