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"Significant Enhancement of HCD and TDDB in CMOS FETs by Mechanical Stress."

Kookjin Lee et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764540

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-09

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  - conf/irps/LeeKKGEOGFVDW22
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  - https://dblp.org/rec/conf/irps/LeeKKGEOGFVDW22
Kookjin Lee, Ben Kaczer, Anastasiia Kruv, Mario Gonzalez, Geert Eneman, Oguzhan O. Okudur, Alexander Grill, Jacopo Franco, Andrea Vici, Robin Degraeve, Ingrid De Wolf:
Significant Enhancement of HCD and TDDB in CMOS FETs by Mechanical Stress. IRPS 2022: 10

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