"System-Level Simulation of Electromigration in a 3 nm CMOS Power Delivery ..."

Houman Zahedmanesh et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764511

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-09

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Houman Zahedmanesh, Ivan Ciofi, Odysseas Zografos, Kristof Croes, Mustafa Badaroglu:
System-Level Simulation of Electromigration in a 3 nm CMOS Power Delivery Network: The Effect of Grid Redundancy, Metallization Stack and Standard-Cell Currents. IRPS 2022: 1-7

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