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"Test set identification for improved delay defect coverage in the presence ..."

Pavan Kumar Javvaji, Basim Shanyour, Spyros Tragoudas (2018)

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DOI: 10.1109/ISQED.2018.8357258

access: closed

type: Conference or Workshop Paper

metadata version: 2018-05-15

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  - conf/isqed/JavvajiST18
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Pavan Kumar Javvaji, Basim Shanyour, Spyros Tragoudas:
Test set identification for improved delay defect coverage in the presence of statistical delays. ISQED 2018: 14-19

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