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"A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage ..."

Takashi Sato et al. (2007)

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DOI: 10.1109/ISQED.2007.17

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-17

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  dblp key:
  - conf/isqed/SatoUHOANM07
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  persistent URL:
  - https://dblp.org/rec/conf/isqed/SatoUHOANM07
Takashi Sato, Takumi Uezono, Shiho Hagiwara, Kenichi Okada, Shuhei Amakawa, Noriaki Nakayama, Kazuya Masu:
A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation. ISQED 2007: 21-26

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