"A mathematical model to assess the influence of parallelism in a ..."

Davide Appello, M. Laurino, Marco Pranzo (2017)

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DOI: 10.1109/ITC-ASIA.2017.8097129

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-16

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Davide Appello, M. Laurino, Marco Pranzo:
A mathematical model to assess the influence of parallelism in a semiconductor back-end test floor. ITC-Asia 2017: 138-143

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