"A Comparison Between Test Pattern Generation Strategies for Functional ..."

Wang Jiang Chau et al. (2002)

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type: Conference or Workshop Paper

metadata version: 2023-07-26

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Wang Jiang Chau, Paulo Sérgio Cardoso, Marius Strum, Ricardo Pires:
A Comparison Between Test Pattern Generation Strategies for Functional Units in BIST Applications. LATW 2002: 61-63

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