"Automated Test-Trace Inspection for Microcontroller Binary Code."

Thomas Reinbacher et al. (2011)

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DOI: 10.1007/978-3-642-29860-8_18

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

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Thomas Reinbacher, Jörg Brauer, Daniel Schachinger, Andreas Steininger, Stefan Kowalewski:
Automated Test-Trace Inspection for Microcontroller Binary Code. RV 2011: 239-244

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