"Exclusive Test and its Applications to Fault Diagnosis."

Vishwani D. Agrawal et al. (2003)

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DOI: 10.1109/ICVD.2003.1183128

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Vishwani D. Agrawal, Dong Hyun Baik, Yong Chang Kim, Kewal K. Saluja:
Exclusive Test and its Applications to Fault Diagnosis. VLSI Design 2003: 143-148

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