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"Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with ..."
Thiago Copetti et al. (2020)
- Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago R. Balen:
Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects. LATS 2020: 1-6
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