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2020 – today
- 2025
[c120]Sicong Yuan
, Changhao Wang, Moritz Fieback, Hanzhi Xun, Mottaqiallah Taouil, Xiuyan Li, Danyang Chen, Lin Wang, Nicolò Bellarmino, Riccardo Cantoro, Said Hamdioui:
Device-Aware Test for Anomalous Charge Trapping in FeFETs. ASP-DAC 2025: 635-641- 2024
- [j33]Abdullah Aljuffri, Ruoyu Huang, Laura Muntenaar, Georgi Gaydadjiev, Kezheng Ma, Said Hamdioui, Mottaqiallah Taouil:
The Security Evaluation of an Efficient Lightweight AES Accelerator. Cryptogr. 8(2): 24 (2024) - [j32]Tara Ghasempouri, Jaan Raik, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
Survey on Architectural Attacks: A Unified Classification and Attack Model. ACM Comput. Surv. 56(2): 42:1-42:32 (2024) - [c119]Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui:
Device-Aware Diagnosis for Yield Learning in RRAMs. DATE 2024: 1-6 - [c118]Hassan Aboushady, Noemie Beringuier-Boher, Kelly Burke, Philippe Dallemagne, Mario De Biase, Manuel Di Frangia, Virginie Deniau, Enrico Ferrari, Christophe Gaquière, Dominique Morche, Fabio Patrone, Stefano Pesci, Luigi Pomante, Andries Stam, Vincenzo Stornelli, Haralampos-G. Stratigopoulos, Mottaqiallah Taouil, Emmanuel Vaumorin, Jonathan Villain, Sander Steeghs:
Trusted SMEs for Sustainable Growth of Europeans Economical Backbone to Strengthen the Digital Sovereignty: The KDT Resilient Trust Project. DSD 2024: 620-627 - [c117]Stefan A. Lung, Georgi Gaydadjiev, Said Hamdioui, Mottaqiallah Taouil:
Counteracting Rowhammer by Data Alternation. ETS 2024: 1-6 - [c116]Fouwad Jamil Mir, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil:
Extracting Weights of CIM-Based Neural Networks Through Power Analysis of Adder-Trees. ETS 2024: 1-4 - [c115]Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui:
Online Detection of Unique Faults in RRAMs. ETS 2024: 1-2 - [c114]Sicong Yuan, Mohammad Amin Yaldagard, Hanzhi Xun, Moritz Fieback, Erik Jan Marinissen, Woojin Kim, Siddharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui:
Design-for-Test for Intermittent Faults in STT-MRAMs. ETS 2024: 1-6 - [c113]Changhao Wang, Sicong Yuan, Hanzhi Xun, Chaobo Li, Mottaqiallah Taouil, Moritz Fieback, Danyang Chen, Xiuyan Li, Lin Wang, Riccardo Cantoro, Chujun Yin, Said Hamdioui:
Defects, Fault Modeling, and Test Development Framework for FeFETs. ITC 2024: 91-95 - [c112]Sicong Yuan, Hanzhi Xun, Woojin Kim, Siddharth Rao, Erik Jan Marinissen, Sebastien Couet, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui:
Testing STT-MRAMs: Do We Need Magnets in our Automated Test Equipment? ITC 2024: 364-373 - [c111]Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Erbing Hua, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui:
Robust Design-for-Testability Scheme for Conventional and Unique Defects in RRAMs. ITC 2024: 374-383 - [c110]Hassen Aziza, Jérémy Postel-Pellerin, Moritz Fieback, Said Hamdioui, Hanzhi Xun, Mottaqiallah Taouil, Karine Coulié, Wenceslas Rahajandraibe:
Analysis of Conductance Variability in RRAM for Accurate Neuromorphic Computing. LATS 2024: 1-5 - [c109]Thiago Copetti, A. Chordia, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Veiras Bolzani:
Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs. LATS 2024: 1-6 - [c108]Abhiroop Bhowmik, Subin Babukutty, Mottaqiallah Taouil, Moritz Fieback:
A Unified Functional Safety EDA Framework for Accurate Diagnostic Coverage Estimation. VLSI-SoC 2024: 1-6 - [c107]Thomas Makryniotis, Georgi Gaydadjiev, Said Hamdioui, Mottaqiallah Taouil:
Multi-Level FeFET-Based CAM Address Decoder. VLSI-SoC 2024: 1-6 - [i8]Muhammad Ali Siddiqi, Jan Andrés Galvan Hernández, Anteneh Gebregiorgis, Rajendra Bishnoi, Christos Strydis, Said Hamdioui, Mottaqiallah Taouil:
Memristor-Based Lightweight Encryption. CoRR abs/2404.00125 (2024) - 2023
- [j31]Troya Çagil Köylü, Cezar Rodolfo Wedig Reinbrecht, Anteneh Gebregiorgis, Said Hamdioui, Mottaqiallah Taouil:
A Survey on Machine Learning in Hardware Security. ACM J. Emerg. Technol. Comput. Syst. 19(2): 18:1-18:37 (2023) - [c106]Ahmed Aouichi, Sicong Yuan, Moritz Fieback, Siddharth Rao, Woojin Kim, Erik Jan Marinissen, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui:
Device Aware Diagnosis for Unique Defects in STT-MRAMs. ATS 2023: 1-6 - [c105]Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mathijs Heidekamp, Thiago Copetti, Letícia Maria Veiras Bolzani Poehls, Mottaqiallah Taouil, Said Hamdioui:
Characterization and Test of Intermittent Over RESET in RRAMs. ATS 2023: 1-6 - [c104]Sicong Yuan, Mottaqiallah Taouil, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui:
Device-Aware Test for Back-Hopping Defects in STT-MRAMs. DATE 2023: 1-6 - [c103]Abdullah Aljuffri, Mudit Saxena, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
A Pre-Silicon Power Leakage Assessment Based on Generative Adversarial Networks. DSD 2023: 87-94 - [c102]Muhammad Ali Siddiqi, Jan Andrés Galvan Hernández, Anteneh Gebreziorgis, Rajendra Bishnoi, Christos Strydis, Said Hamdioui, Mottaqiallah Taouil:
Memristor-Based Lightweight Encryption. DSD 2023: 634-641 - [c101]Moritz Fieback, Filip Bradaric, Mottaqiallah Taouil, Said Hamdioui:
Online Fault Detection and Diagnosis in RRAM. ETS 2023: 1-6 - [c100]Manil Dev Gomony, Anteneh Gebregiorgis, Moritz Fieback, Marc Geilen, Sander Stuijk, Jan Richter-Brockmann, Rajendra Bishnoi, Sven Argo, Lara Arche Andradas, Tim Güneysu, Mottaqiallah Taouil, Henk Corporaal, Said Hamdioui:
Dependability of Future Edge-AI Processors: Pandora's Box. ETS 2023: 1-6 - [c99]Hanzhi Xun, Moritz Fieback, Sicong Yuan, Ziwei Zhang, Mottaqiallah Taouil, Said Hamdioui:
Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs. ETS 2023: 1-6 - [c98]Sicong Yuan, Ziwei Zhang, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui:
Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs. ITC 2023: 236-245 - [c97]Hanzhi Xun, Sicong Yuan, Moritz Fieback, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui:
Device-Aware Test for Ion Depletion Defects in RRAMs. ITC 2023: 246-255 - [c96]Ruoyu Huang, Abdullah Aljuffri, Said Hamdioui, Kezheng Ma, Mottaqiallah Taouil:
Securing an Efficient Lightweight AES Accelerator. TrustCom 2023: 841-848 - [c95]Shayesteh Masoumian, Roel Maes, Rui Wang, Karthik Keni Yerriswamy, Geert Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil:
Modeling and Analysis of SRAM PUF Bias Patterns in 14nm and 7nm FinFET Technology Nodes. VLSI-SoC 2023: 1-6 - 2022
- [j30]Sohaib Majzoub, Resve A. Saleh, Mottaqiallah Taouil, Said Hamdioui, Mohamed Bamakhrama:
Rapid Design-Space Exploration for Low-Power Manycores Under Process Variation Utilizing Machine Learning. IEEE Access 10: 70187-70203 (2022) - [j29]Moritz Fieback, Guilherme Cardoso Medeiros, Lizhou Wu, Hassen Aziza, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui:
Defects, Fault Modeling, and Test Development Framework for RRAMs. ACM J. Emerg. Technol. Comput. Syst. 18(3): 52:1-52:26 (2022) - [j28]Anteneh Gebregiorgis, Hoang Anh Du Nguyen, Jintao Yu, Rajendra Bishnoi, Mottaqiallah Taouil, Francky Catthoor, Said Hamdioui:
A Survey on Memory-centric Computer Architectures. ACM J. Emerg. Technol. Comput. Syst. 18(4): 79:1-79:50 (2022) - [j27]Troya Çagil Köylü, Cezar Rodolfo Wedig Reinbrecht, Marcelo Brandalero, Said Hamdioui, Mottaqiallah Taouil:
Instruction flow-based detectors against fault injection attacks. Microprocess. Microsystems 94: 104638 (2022) - [j26]Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui:
Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs. IEEE Trans. Computers 71(9): 2219-2233 (2022) - [j25]Jintao Yu, Muath Abu Lebdeh, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui:
APmap: An Open-Source Compiler for Automata Processors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(1): 196-200 (2022) - [j24]Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui:
MFA-MTJ Model: Magnetic-Field-Aware Compact Model of pMTJ for Robust STT-MRAM Design. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(11): 4991-5004 (2022) - [c94]Troya Çagil Köylü, Moritz Fieback, Said Hamdioui, Mottaqiallah Taouil:
Using Hopfield Networks to Correct Instruction Faults. ATS 2022: 102-107 - [c93]Shayesteh Masoumian, Georgios N. Selimis, Rui Wang, Geert Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil:
Reliability Analysis of FinFET-Based SRAM PUFs for 16nm, 14nm, and 7nm Technology Nodes. DATE 2022: 1189-1192 - [c92]Troya Çagil Köylü, Luíza C. Garaffa, Cezar Reinbrecht, Mahdi Zahedi, Said Hamdioui, Mottaqiallah Taouil:
Exploiting PUF Variation to Detect Fault Injection Attacks. DDECS 2022: 74-79 - [c91]Moritz Fieback, Christopher Münch, Anteneh Gebregiorgis, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Mehdi B. Tahoori:
PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory. ETS 2022: 1-6 - [c90]Troya Çagil Köylü, Said Hamdioui, Mottaqiallah Taouil:
Smart Redundancy Schemes for ANNs Against Fault Attacks. ETS 2022: 1-2 - [c89]Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letícia Maria Veiras Bolzani, Said Hamdioui:
Hierarchical Memory Diagnosis. ETS 2022: 1-2 - [c88]Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui:
Structured Test Development Approach for Computation-in-Memory Architectures. ITC-Asia 2022: 61-66 - [c87]Cemil Cem Gürsoy, Daniel Kraak, Foisal Ahmed, Mottaqiallah Taouil, Maksim Jenihhin, Said Hamdioui:
On BTI Aging Rejuvenation in Memory Address Decoders. LATS 2022: 1-6 - [i7]Tara Ghasempouri, Jaan Raik, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
Survey on Architectural Attacks: A Unified Classification and Attack Model. CoRR abs/2208.14194 (2022) - [i6]Cemil Cem Gürsoy, Daniel Kraak, Foisal Ahmed, Mottaqiallah Taouil, Maksim Jenihhin, Said Hamdioui:
On BTI Aging Rejuvenation in Memory Address Decoders. CoRR abs/2212.09356 (2022) - 2021
- [j23]Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Bolzani Poehls, Tiago Roberto Balen:
Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects. J. Electron. Test. 37(3): 383-394 (2021) - [j22]Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, Moritz Fieback, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui:
Defect and Fault Modeling Framework for STT-MRAM Testing. IEEE Trans. Emerg. Top. Comput. 9(2): 707-723 (2021) - [j21]Guilherme Cardoso Medeiros, Moritz Fieback, Lizhou Wu, Mottaqiallah Taouil, Letícia Maria Bolzani Poehls, Said Hamdioui:
Hard-to-Detect Fault Analysis in FinFET SRAMs. IEEE Trans. Very Large Scale Integr. Syst. 29(6): 1271-1284 (2021) - [j20]Abdullah Aljuffri, Marc Zwalua, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
Applying Thermal Side-Channel Attacks on Asymmetric Cryptography. IEEE Trans. Very Large Scale Integr. Syst. 29(11): 1930-1942 (2021) - [c86]Cezar Reinbrecht, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil, Johanna Sepúlveda:
GRINCH: A Cache Attack against GIFT Lightweight Cipher. DATE 2021: 549-554 - [c85]Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui:
Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM. DATE 2021: 1717-1722 - [c84]Hassen Aziza, Said Hamdioui, Moritz Fieback, Mottaqiallah Taouil, Mathieu Moreau:
Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation. DATE 2021: 1877-1880 - [c83]Troya Çagil Köylü, Hans Okkerman, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
Protecting IoT Devices through a Hardware-driven Memory Verification. DSD 2021: 115-122 - [c82]Luíza C. Garaffa, Abdullah Aljuffri, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil, Johanna Sepúlveda:
Revealing the Secrets of Spiking Neural Networks: The Case of Izhikevich Neuron. DSD 2021: 514-518 - [c81]Abdullah Aljuffri, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
Impact of Data Pre-Processing Techniques on Deep Learning Based Power Attacks. DTIS 2021: 1-6 - [c80]G. Cardoso Medeiros, Moritz Fieback, Thiago Santos Copetti, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia B. Poehls, Said Hamdioui:
Improving the Detection of Undefined State Faults in FinFET SRAMs. DTIS 2021: 1-6 - [c79]Mottaqiallah Taouil, Abdullah Aljuffri, Said Hamdioui:
Power Side Channel Attacks: Where Are We Standing? DTIS 2021: 1-6 - [c78]Moritz Fieback, Guilherme Cardoso Medeiros, Anteneh Gebregiorgis, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui:
Intermittent Undefined State Fault in RRAMs. ETS 2021: 1-6 - [c77]G. Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia Bolzani Poehls, Said Hamdioui:
Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs. ETS 2021: 1-6 - [c76]Mottaqiallah Taouil, Cezar Reinbrecht, Said Hamdioui, Johanna Sepúlveda:
LightRoAD: Lightweight Rowhammer Attack Detector. ISVLSI 2021: 362-367 - [c75]Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui:
Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions. ITC 2021: 143-152 - [c74]Troya Çagil Köylü, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
Deterministic and Statistical Strategies to Protect ANNs against Fault Injection Attacks. PST 2021: 1-10 - [c73]Abdullah Aljuffri, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
Multi-Bit Blinding: A Countermeasure for RSA Against Side Channel Attacks. VTS 2021: 1-6 - 2020
- [j19]Hassen Aziza, Mathieu Moreau, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui:
An Energy-Efficient Current-Controlled Write and Read Scheme for Resistive RAMs (RRAMs). IEEE Access 8: 137263-137274 (2020) - [j18]Hoang Anh Du Nguyen, Jintao Yu, Muath Abu Lebdeh, Mottaqiallah Taouil, Said Hamdioui, Francky Catthoor:
A Classification of Memory-Centric Computing. ACM J. Emerg. Technol. Comput. Syst. 16(2): 13:1-13:26 (2020) - [j17]Jintao Yu, Razvan Nane, Imran Ashraf, Mottaqiallah Taouil, Said Hamdioui, Henk Corporaal, Koen Bertels:
Skeleton-Based Synthesis Flow for Computation-in-Memory Architectures. IEEE Trans. Emerg. Top. Comput. 8(2): 545-558 (2020) - [c72]Jintao Yu, Muath Abu Lebdeh, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui:
The Power of Computation-in-Memory Based on Memristive Devices. ASP-DAC 2020: 385-392 - [c71]Maksim Jenihhin, Said Hamdioui, Matteo Sonza Reorda, Milos Krstic, Peter Langendörfer, Christian Sauer, Anton Klotz, Michael Hübner, Jörg Nolte, Heinrich Theodor Vierhaus, Georgios N. Selimis, Dan Alexandrescu, Mottaqiallah Taouil, Geert Jan Schrijen, Jaan Raik, Luca Sterpone, Giovanni Squillero, Zoya Dyka:
RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems. DATE 2020: 388-393 - [c70]Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui:
A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs. DATE 2020: 792-797 - [c69]Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui:
Impact of Magnetic Coupling and Density on STT-MRAM Performance. DATE 2020: 1211-1216 - [c68]Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
Mitigation of Sense Amplifier Degradation Using Skewed Design. DATE 2020: 1614-1617 - [c67]Tara Ghasempouri, Jaan Raik, Kolin Paul, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
A Security Verification Template to Assess Cache Architecture Vulnerabilities. DDECS 2020: 1-6 - [c66]Daniël Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
eSRAM Reliability: Why is it still not optimally solved? DTIS 2020: 1-6 - [c65]Moritz Fieback, Surya Nagarajan, Rajendra Bishnoi, Mehdi B. Tahoori, Mottaqiallah Taouil, Said Hamdioui:
Testing Scouting Logic-Based Computation-in-Memory Architectures. ETS 2020: 1-6 - [c64]Bruno Forlin, Ronaldo Husemann, Luigi Carro, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
G-PUF: An Intrinsic PUF Based on GPU Error Signatures. ETS 2020: 1-2 - [c63]Shayesteh Masoumian, Georgios N. Selimis, Roel Maes, Geert Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil:
Modeling Static Noise Margin for FinFET based SRAM PUFs. ETS 2020: 1-6 - [c62]Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil, Behrad Niazmand, Tara Ghasempouri, Jaan Raik, Johanna Sepúlveda:
LiD-CAT: A Lightweight Detector for Cache ATtacks. ETS 2020: 1-6 - [c61]Lizhou Wu, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui:
Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level. ETS 2020: 1-2 - [c60]Troya Çagil Köylü, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
RNN-Based Detection of Fault Attacks on RSA. ISCAS 2020: 1-5 - [c59]Cezar Reinbrecht, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil, Bruno Forlin, Johanna Sepúlveda:
Guard-NoC: A Protection Against Side-Channel Attacks for MPSoCs. ISVLSI 2020: 536-541 - [c58]Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui:
Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs. ITC 2020: 1-10 - [c57]Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago R. Balen:
Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects. LATS 2020: 1-6 - [c56]Abdullah Aljuffri, Pradeep Venkatachalam, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
S-NET: A Confusion Based Countermeasure Against Power Attacks for SBOX. SAMOS 2020: 295-307 - [i5]Lizhou Wu, Mottaqiallah Taouil, Siddharth Rao, Erik Jan Marinissen, Said Hamdioui:
Survey on STT-MRAM Testing: Failure Mechanisms, Fault Models, and Tests. CoRR abs/2001.05463 (2020) - [i4]Haji Akhundov, Erik van der Sluis, Said Hamdioui, Mottaqiallah Taouil:
Public-Key Based Authentication Architecture for IoT Devices Using PUF. CoRR abs/2002.01277 (2020) - [i3]Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui:
Impact of Magnetic Coupling and Density on STT-MRAM Performance. CoRR abs/2011.11349 (2020)
2010 – 2019
- 2019
- [j16]Sohaib Majzoub, Resve A. Saleh, Imran Ashraf, Mottaqiallah Taouil, Said Hamdioui:
Energy Optimization for Large-Scale 3D Manycores in the Dark-Silicon Era. IEEE Access 7: 33115-33129 (2019) - [j15]Sohaib Majzoub, Mottaqiallah Taouil, Said Hamdioui:
System-Level Sub-20 nm Planar and FinFET CMOS Delay Modelling for Supply and Threshold Voltage Scaling Under Process Variation. J. Low Power Electron. 15(1): 1-10 (2019) - [j14]Elena-Ioana Vatajelu, Paolo Prinetto, Mottaqiallah Taouil, Said Hamdioui:
Challenges and Solutions in Emerging Memory Testing. IEEE Trans. Emerg. Top. Comput. 7(3): 493-506 (2019) - [j13]Daniel Kraak, Mottaqiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM. IEEE Trans. Very Large Scale Integr. Syst. 27(6): 1308-1321 (2019) - [c55]Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
Methodology for Application-Dependent Degradation Analysis of Memory Timing. DATE 2019: 162-167 - [c54]Said Hamdioui, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Abu Sebastian, Manuel Le Gallo, Sandeep Pande, Siebren Schaafsma, Francky Catthoor, Shidhartha Das, Fernando García-Redondo, Geethan Karunaratne, Abbas Rahimi, Luca Benini:
Applications of Computation-In-Memory Architectures based on Memristive Devices. DATE 2019: 486-491 - [c53]Jintao Yu, Hoang Anh Du Nguyen, Muath Abu Lebdeh, Mottaqiallah Taouil, Said Hamdioui:
Time-division Multiplexing Automata Processor. DATE 2019: 794-799 - [c52]Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
Hardware-Based Aging Mitigation Scheme for Memory Address Decoder. ETS 2019: 1-6 - [c51]Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, Leticia Bolzani Poehls, Said Hamdioui:
DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs. ETS 2019: 1-2 - [c50]Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Erik Jan Marinissen, Farrukh Yasin, Sebastien Couet, Said Hamdioui, Gouri Sankar Kar:
Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing. ETS 2019: 1-6 - [c49]Innocent Okwudili Agbo, Mottaqiallah Taouil, Said Hamdioui:
Reliability Modeling and Mitigation for Embedded Memories. ITC 2019: 1-10 - [c48]Moritz Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, Siddharth Rao, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui:
Device-Aware Test: A New Test Approach Towards DPPB Level. ITC 2019: 1-10 - [c47]Said Hamdioui, Moritz Fieback, Surya Nagarajan, Mottaqiallah Taouil:
Testing Computation-in-Memory Architectures Based on Emerging Memories. ITC 2019: 1-10 - [c46]Daniel H. P. Kraak, Cemil Cem Gürsoy, Innocent O. Agbo, Mottaqiallah Taouil, Maksim Jenihhin, Jaan Raik, Said Hamdioui:
Software-Based Mitigation for Memory Address Decoder Aging. LATS 2019: 1-6 - [c45]Hoang Anh Du Nguyen, Jintao Yu, Muath Abu Lebdeh, Mottaqiallah Taouil, Said Hamdioui:
A computation-in-memory accelerator based on resistive devices. MEMSYS 2019: 19-32 - [c44]Jintao Yu, Hoang Anh Du Nguyen, Muath Abu Lebdeh, Mottaqiallah Taouil, Said Hamdioui:
Enhanced Scouting Logic: A Robust Memristive Logic Design Scheme. NANOARCH 2019: 1-6 - [i2]Jintao Yu, Hoang Anh Du Nguyen, Lei Xie, Mottaqiallah Taouil, Said Hamdioui:
Memristive Devices for Computation-In-Memory. CoRR abs/1907.07898 (2019) - [i1]Maksim Jenihhin, Said Hamdioui, Matteo Sonza Reorda, Milos Krstic, Peter Langendörfer, Christian Sauer, Anton Klotz, Michael Hübner, Jörg Nolte, Heinrich Theodor Vierhaus, Georgios N. Selimis, Dan Alexandrescu, Mottaqiallah Taouil, Geert Jan Schrijen, Jaan Raik, Luca Sterpone, Giovanni Squillero, Zoya Dyka:
RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems. CoRR abs/1912.01561 (2019) - 2018
- [j12]Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene:
Impact and mitigation of SRAM read path aging. Microelectron. Reliab. 87: 158-167 (2018) - [j11]G. Cardoso Medeiros, Letícia Maria Veiras Bolzani, Mottaqiallah Taouil, Fabian Vargas, Said Hamdioui:
A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs. Microelectron. Reliab. 88-90: 355-359 (2018) - [j10]Imran Ashraf, Nader Khammassi, Mottaqiallah Taouil, Koen Bertels:
Memory and Communication Profiling for Accelerator-Based Platforms. IEEE Trans. Computers 67(7): 934-948 (2018) - [j9]Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui, Koen Bertels:
A Mapping Methodology of Boolean Logic Circuits on Memristor Crossbar. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(2): 311-323 (2018) - [c43]Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
Degradation analysis of high performance 14nm FinFET SRAM. DATE 2018: 201-206 - [c42]Jintao Yu, Hoang Anh Du Nguyen, Lei Xie, Mottaqiallah Taouil, Said Hamdioui:
Memristive devices for computation-in-memory. DATE 2018: 1646-1651 - [c41]Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Francky Catthoor, Abhijit Chatterjee, Adit D. Singh, Hans-Joachim Wunderlich, Naghmeh Karimi:
Device aging: A reliability and security concern. ETS 2018: 1-10 - [c40]Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui:
Testing Resistive Memories: Where are We and What is Missing? ITC 2018: 1-9 - [c39]Lizhou Wu, Mottaqiallah Taouil, Siddharth Rao, Erik Jan Marinissen, Said Hamdioui:
Electrical Modeling of STT-MRAM Defects. ITC 2018: 1-10 - [c38]Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, Marco Rovatti:
Ionizing radiation modeling in DRAM transistors. LATS 2018: 1-6 - 2017
- [j8]Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor:
Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier. IEEE Trans. Very Large Scale Integr. Syst. 25(4): 1444-1454 (2017) - [j7]Hoang Anh Du Nguyen, Lei Xie, Mottaqiallah Taouil, Razvan Nane, Said Hamdioui, Koen Bertels:
On the Implementation of Computation-in-Memory Parallel Adder. IEEE Trans. Very Large Scale Integr. Syst. 25(8): 2206-2219 (2017) - [j6]Daniel Kraak, Mottaqiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic Workloads. IEEE Trans. Very Large Scale Integr. Syst. 25(12): 3464-3472 (2017) - [c37]Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene:
Mitigation of sense amplifier degradation using input switching. DATE 2017: 858-863 - [c36]Lei Xie, Hoang Anh Du Nguyen, Jintao Yu, Mottaqiallah Taouil, Said Hamdioui:
On the robustness of memristor based logic gates. DDECS 2017: 158-163 - [c35]Hoang Anh Du Nguyen, Lei Xie, Jintao Yu, Mottaqiallah Taouil, Said Hamdioui:
Interconnect networks for resistive computing architectures. DTIS 2017: 1-6 - [c34]Lei Xie, Hoang Anh Du Nguyen, Jintao Yu, Ali Kaichouhi, Mottaqiallah Taouil, Mohammad AlFailakawi, Said Hamdioui:
Scouting Logic: A Novel Memristor-Based Logic Design for Resistive Computing. ISVLSI 2017: 176-181 - [c33]Hoang Anh Du Nguyen, Jintao Yu, Lei Xie, Mottaqiallah Taouil, Said Hamdioui, Dietmar Fey:
Memristive devices for computing: Beyond CMOS and beyond von Neumann. VLSI-SoC 2017: 1-10 - 2016
- [c32]Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor:
Comparative BTI analysis for various sense amplifier designs. DDECS 2016: 68-73 - [c31]Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui, Koen Bertels:
Boolean logic gate exploration for memristor crossbar. DTIS 2016: 1-6 - [c30]Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene:
Read path degradation analysis in SRAM. ETS 2016: 1-2 - [c29]Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui, Koen Bertels, Mohammad AlFailakawi:
Non-volatile look-up table based FPGA implementations. IDT 2016: 165-170 - [c28]Adib Haron, Jintao Yu, Razvan Nane, Mottaqiallah Taouil, Said Hamdioui, Koen Bertels:
Parallel matrix multiplication on memristor-based computation-in-memory architecture. HPCS 2016: 759-766 - [c27]Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor, Wim Dehaene:
Quantification of Sense Amplifier Offset Voltage Degradation due to Zero-and Run-Time Variability. ISVLSI 2016: 725-730 - [c26]Hoang Anh Du Nguyen, Lei Xie, Mottaqiallah Taouil, Said Hamdioui, Koen Bertels:
Synthesizing HDL to memristor technology: A generic framework. NANOARCH 2016: 43-48 - 2015
- [j5]Said Hamdioui, Mottaqiallah Taouil, Nor Zaidi Haron:
Testing Open Defects in Memristor-Based Memories. IEEE Trans. Computers 64(1): 247-259 (2015) - [j4]Mottaqiallah Taouil, Mahmoud Masadeh, Said Hamdioui, Erik Jan Marinissen:
Post-Bond Interconnect Test and Diagnosis for 3-D Memory Stacked on Logic. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(11): 1860-1872 (2015) - [j3]Mottaqiallah Taouil, Said Hamdioui, Erik Jan Marinissen:
Yield Improvement for 3D Wafer-to-Wafer Stacked ICs Using Wafer Matching. ACM Trans. Design Autom. Electr. Syst. 20(2): 19:1-19:23 (2015) - [c25]Said Hamdioui, Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Koen Bertels, Henk Corporaal, Hailong Jiao, Francky Catthoor, Dirk J. Wouters, Eike Linn, Jan van Lunteren:
Memristor based computation-in-memory architecture for data-intensive applications. DATE 2015: 1718-1725 - [c24]Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Stefan Cosemans, Pieter Weckx, Praveen Raghavan, Francky Catthoor:
Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier. DTIS 2015: 1-6 - [c23]Yiorgos Sfikas, Yiorgos Tsiatouhas, Mottaqiallah Taouil, Said Hamdioui:
On resistive open defect detection in DRAMs: The charge accumulation effect. ETS 2015: 1-6 - [c22]Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Koen Bertels, Said Hamdioui:
Fast boolean logic mapped on memristor crossbar. ICCD 2015: 335-342 - [c21]Imran Ashraf, Mottaqiallah Taouil, Koen Bertels:
Memory profiling for intra-application data-communication quantification: A survey. IDT 2015: 32-37 - [c20]Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
BTI analysis of SRAM write driver. IDT 2015: 100-105 - [c19]Hoang Anh Du Nguyen, Lei Xie, Mottaqiallah Taouil, Razvan Nane, Said Hamdioui, Koen Bertels:
Computation-in-memory based parallel adder. NANOARCH 2015: 57-62 - [c18]Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui, Koen Bertels:
Interconnect networks for memristor crossbar. NANOARCH 2015: 124-129 - [c17]Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor:
Integral impact of BTI and voltage temperature variation on SRAM sense amplifier. VTS 2015: 1-6 - 2014
- [b1]Mottaqiallah Taouil:
Yield and Cost Analysis or 3D Stacked ICs. Delft University of Technology, Netherlands, 2014 - [c16]Mottaqiallah Taouil, Mahmoud Masadeh, Said Hamdioui, Erik Jan Marinissen:
Interconnect test for 3D stacked memory-on-logic. DATE 2014: 1-6 - [c15]Erik Jan Marinissen, Bart De Wachter, Ken Smith, Jorg Kiesewetter, Mottaqiallah Taouil, Said Hamdioui:
Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface. ITC 2014: 1-10 - [c14]Mottaqiallah Taouil, Said Hamdioui, Erik Jan Marinissen:
Quality versus cost analysis for 3D Stacked ICs. VTS 2014: 1-6 - 2013
- [c13]Mottaqiallah Taouil, Said Hamdioui, Erik Jan Marinissen, Sudipta Bhawmik:
Using 3D-COSTAR for 2.5D test cost optimization. 3DIC 2013: 1-8 - [c12]Mihai Lefter, George Razvan Voicu, Mottaqiallah Taouil, Marius Enachescu, Said Hamdioui, Sorin Dan Cotofana:
Is TSV-based 3D integration suitable for inter-die memory repair? DATE 2013: 1251-1254 - [c11]Mottaqiallah Taouil, Said Hamdioui, Erik Jan Marinissen, Sudipta Bhawmik:
Impact of mid-bond testing in 3D stacked ICs. DFTS 2013: 178-183 - [c10]Seyab Khan, Mottaqiallah Taouil, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor:
Impact of partial resistive defects and Bias Temperature Instability on SRAM decoder reliablity. IDT 2013: 1-6 - [c9]Mottaqiallah Taouil, Mihai Lefter, Said Hamdioui:
Exploring test opportunities for memory and interconnects in 3D ICs. IDT 2013: 1-6 - 2012
- [j2]Mottaqiallah Taouil, Said Hamdioui, Kees Beenakker, Erik Jan Marinissen:
Test Impact on the Overall Die-to-Wafer 3D Stacked IC Cost. J. Electron. Test. 28(1): 15-25 (2012) - [j1]Mottaqiallah Taouil, Said Hamdioui:
Yield Improvement for 3D Wafer-to-Wafer Stacked Memories. J. Electron. Test. 28(4): 523-534 (2012) - [c8]Mottaqiallah Taouil, Said Hamdioui:
On optimizing test cost for Wafer-to-Wafer 3D-stacked ICs. DTIS 2012: 1-6 - 2011
- [c7]Said Hamdioui, Mottaqiallah Taouil:
Yield Improvement and Test Cost Optimization for 3D Stacked ICs. Asian Test Symposium 2011: 480-485 - [c6]Mottaqiallah Taouil, Said Hamdioui:
Stacking order impact on overall 3D die-to-wafer Stacked-IC cost. DDECS 2011: 335-340 - [c5]Mottaqiallah Taouil, Said Hamdioui:
Layer Redundancy Based Yield Improvement for 3D Wafer-to-Wafer Stacked Memories. ETS 2011: 45-50 - [c4]Mottaqiallah Taouil, Said Hamdioui, Erik Jan Marinissen:
On modeling and optimizing cost in 3D Stacked-ICs. IDT 2011: 24-29 - 2010
- [c3]Mottaqiallah Taouil, Said Hamdioui, Kees Beenakker, Erik Jan Marinissen:
Test Cost Analysis for 3D Die-to-Wafer Stacking. Asian Test Symposium 2010: 435-441 - [c2]Laiq Hasan, Zaid Al-Ars, Mottaqiallah Taouil, Koen Bertels:
Performance and bandwidth optimization for biological sequence alignment. IDT 2010: 155-160 - [c1]Mottaqiallah Taouil, Said Hamdioui, Jouke Verbree, Erik Jan Marinissen:
On maximizing the compound yield for 3D Wafer-to-Wafer stacked ICs. ITC 2010: 183-192
Coauthor Index
Letícia Maria Veiras Bolzani
aka: Letícia Maria Veiras Bolzani Poehls
aka: Letícia Maria Bolzani Poehls
aka: Leticia B. Poehls
aka: Leticia Bolzani Poehls
aka: Letícia Maria Veiras Bolzani Poehls
aka: Letícia Maria Bolzani Poehls
aka: Leticia B. Poehls
aka: Leticia Bolzani Poehls
[c120] [j33] [j32] [c119] [c117] [c116] [c115] [c114] [c113] [c112] [c111] [c110] [c109] [c107] [i8] [j31] [c106] [c105] [c104] [c103] [c102] [c101] [c100] [c99] [c98] [c97] [c96] [c95] [j30] [j29] [j28] [j27] [j26] [j25] [j24] [c94] [c93] [c92] [c91] [c90] [c89] [c88] [c87] [i7] [i6] [j23] [j22] [j21] [j20] [c86] [c85] [c84] [c83] [c82] [c81] [c80] [c79] [c78] [c77] [c76] [c75] [c74] [c73] [j19] [j18] [j17] [c72] [c71] [c70] [c69] [c68] [c67] [c66] [c65] [c64] [c63] [c62] [c61] [c60] [c59] [c58] [c57] [c56] [i5] [i4] [i3] [j16] [j15] [j14] [j13] [c55] [c54] [c53] [c52] [c51] [c50] [c49] [c48] [c47] [c46] [c45] [c44] [i2] [i1] [j12] [j11] [j9] [c43] [c42] [c41] [c40] [c39] [c38] [j8] [j7] [j6] [c37] [c36] [c35] [c34] [c33] [c32] [c31] [c30] [c29] [c28] [c27] [c26] [j5] [j4] [j3] [c25] [c24] [c23] [c22] [c20] [c19] [c18] [c17] [c16] [c15] [c14] [c13] [c12] [c11] [c10] [c9] [j2] [j1] [c8] [c7] [c6] [c5] [c4] [c3] [c1]
G. Cardoso Medeiros
aka: Guilherme Cardoso Medeiros
aka: Guilherme Cardoso Medeiros
Cezar Reinbrecht
aka: Cezar Rodolfo Wedig Reinbrecht
aka: Cezar Rodolfo Wedig Reinbrecht
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