"Metrics reloaded: Pitfalls and recommendations for image analysis validation."

Lena Maier-Hein et al. (2022)

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DOI: 10.48550/ARXIV.2206.01653

access: open

type: Informal or Other Publication

metadata version: 2025-03-03

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Lena Maier-Hein, Annika Reinke, Evangelia Christodoulou, Ben Glocker, Patrick Godau, Fabian Isensee, Jens Kleesiek, Michal Kozubek, Mauricio Reyes, Michael A. Riegler, Manuel Wiesenfarth, Michael Baumgartner, Matthias Eisenmann, Doreen Heckmann-Nötzel, A. Emre Kavur, Tim Rädsch, Minu Dietlinde Tizabi, Laura Ación, Michela Antonelli, Tal Arbel, Spyridon Bakas, Peter Bankhead, Arriel Benis, M. Jorge Cardoso, Veronika Cheplygina, Beth A. Cimini, Gary S. Collins, Keyvan Farahani, Bram van Ginneken, Daniel A. Hashimoto, Michael M. Hoffman, Merel Huisman, Pierre Jannin, Charles E. Kahn, Alexandros Karargyris, Alan Karthikesalingam, Hannes Kenngott, Annette Kopp-Schneider, Anna Kreshuk, Tahsin M. Kurç, Bennett A. Landman, Geert Litjens, Amin Madani, Klaus H. Maier-Hein, Anne L. Martel, Peter Mattson, Erik Meijering, Bjoern H. Menze, David Moher, Karel G. M. Moons, Henning Müller, Felix Nickel, Brennan Nichyporuk, Jens Petersen, Nasir M. Rajpoot, Nicola Rieke, Julio Saez-Rodriguez, Clarisa Sánchez Gutiérrez, Shravya Shetty, Maarten van Smeden, Carole H. Sudre, Ronald M. Summers, Abdel A. Taha, Sotirios A. Tsaftaris, Ben Van Calster, Gaël Varoquaux, Paul F. Jäger:
Metrics reloaded: Pitfalls and recommendations for image analysis validation. CoRR abs/2206.01653 (2022)

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