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"Concurrent Device/Specification Cause-Effect Monitoring for Yield ..."
Shyam Kumar Devarakond et al. (2012)
- Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee:
Concurrent Device/Specification Cause-Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures. IEEE Des. Test Comput. 29(1): 48-58 (2012)
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