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ORCIDShyam Kumar Devarakond
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2010 – 2019
- 2016
[j7]Shyam Kumar Devarakond, Shreyas Sen, Aritra Banerjee
, Abhijit Chatterjee:
Digitally Assisted Built-In Tuning Using Hamming Distance Proportional Signatures in RF Circuits. IEEE Trans. Very Large Scale Integr. Syst. 24(9): 2918-2931 (2016)- 2015
- [j6]Vishwanath Natarajan, Aritra Banerjee, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee:
Yield Recovery of RF Transceiver Systems Using Iterative Tuning-Driven Power-Conscious Performance Optimization. IEEE Des. Test 32(1): 61-69 (2015) - [j5]Debashis Banerjee, Shyam Kumar Devarakond, Xian Wang, Shreyas Sen, Abhijit Chatterjee:
Real-Time Use-Aware Adaptive RF Transceiver Systems for Energy Efficiency Under BER Constraints. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(8): 1209-1222 (2015) - 2014
- [j4]Shreyas Sen, Vishwanath Natarajan, Shyam Kumar Devarakond, Abhijit Chatterjee:
Process-Variation Tolerant Channel-Adaptive Virtually Zero-Margin Low-Power Wireless Receiver Systems. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(12): 1764-1777 (2014) - [c19]Avhishek Chatterjee, Hua Wang, Abhijit Banerjee, Debashis Banerjee, Banerjee Natarajan, Shreyas Sen, Shyam Kumar Devarakond:
Design of self-healing mixed-signal/RF systems and support CAD tools: A scalable approach. MWSCAS 2014: 1065-1068 - 2013
- [c18]Debashis Banerjee, Shyam Kumar Devarakond, Shreyas Sen, Abhijit Chatterjee:
Real-time use-aware adaptive MIMO RF receiver systems for energy efficiency under BER constraints. DAC 2013: 56:1-56:7 - [c17]Shyam Kumar Devarakond, Debashis Banerjee, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee:
Efficient system-level testing and adaptive tuning of MIMO-OFDM wireless transmitters. ETS 2013: 1-6 - [c16]Shyam Kumar Devarakond, Jennifer McCoy, Amit Nahar, John M. Carulli Jr., Soumendu Bhattacharya, Abhijit Chatterjee:
Predicting die-level process variations from wafer test data for analog devices: A feasibility study. LATW 2013: 1-6 - [c15]Debashis Banerjee, Aritra Banerjee, Shyam Kumar Devarakond, Abhijit Chatterjee:
Adaptive MIMO RF systems: Post-manufacture and real-time tuning for performance maximization and power minimization. MWSCAS 2013: 1095-1099 - 2012
- [j3]Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee:
Concurrent Device/Specification Cause-Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures. IEEE Des. Test Comput. 29(1): 48-58 (2012) - [j2]Shreyas Sen, Aritra Banerjee, Vishwanath Natarajan, Shyam Kumar Devarakond, Hyun Woo Choi, Abhijit Chatterjee:
BIST/Digital-Compatible Testing of RF Devices Using Distortion Model Fitting. J. Electron. Test. 28(4): 405-419 (2012) - [j1]Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee:
Phase Distortion to Amplitude Conversion-Based Low-Cost Measurement of AM-AM and AM-PM Effects in RF Power Amplifiers. IEEE Trans. Very Large Scale Integr. Syst. 20(9): 1602-1614 (2012) - [c14]Aritra Banerjee, Shyam Kumar Devarakond, Shreyas Sen, Debashis Banerjee, Abhijit Chatterjee:
Testing of digitally assisted adaptive analog/RF systems using tuning knob - Performance space estimation. ETS 2012: 1 - [c13]Abhijit Chatterjee, Sabyasachi Deyati, Barry John Muldrey, Shyam Kumar Devarakond, Aritra Banerjee:
Validation signature testing: A methodology for post-silicon validation of analog/mixed-signal circuits. ICCAD 2012: 553-556 - [c12]Debashis Banerjee, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee:
Power Aware Post-Manufacture Tuning of MIMO Receiver Systems. VLSI Design 2012: 143-148 - 2011
- [c11]Aritra Banerjee, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee:
Accurate signature driven power conscious tuning of RF systems using hierarchical performance models. ITC 2011: 1-9 - [c10]Aritra Banerjee, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee:
Automatic test stimulus generation for accurate diagnosis of RF systems using transient response signatures. VTS 2011: 58-63 - 2010
- [c9]Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee:
Rapid Radio Frequency Amplitude and Phase Distortion Measurement Using Amplitude Modulated Stimulus. Asian Test Symposium 2010: 277-282 - [c8]Shyam Kumar Devarakond, Shreyas Sen, Vishwanath Natarajan, Aritra Banerjee, Hyun Woo Choi, Ganesh Srinivasan, Abhijit Chatterjee:
Digitally Assisted Concurrent Built-In Tuning of RF Systems Using Hamming Distance Proportional Signatures. Asian Test Symposium 2010: 283-288 - [c7]Shyam Kumar Devarakond, Shreyas Sen, Aritra Banerjee, Vishwanath Natarajan, Abhijit Chatterjee:
Built-in performance monitoring of mixed-signal/RF front ends using real-time parameter estimation. IOLTS 2010: 77-82 - [c6]Vishwanath Natarajan, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee:
A holistic approach to accurate tuning of RF systems for large and small multiparameter perturbations. VTS 2010: 331-336 - [c5]Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee:
Concurrent process model and specification cause-effect monitoring using alternate diagnostic signatures. VTS 2010: 337-342
2000 – 2009
- 2009
- [c4]Vishwanath Natarajan, Shyam Kumar Devarakond, Shreyas Sen, Abhijit Chatterjee:
BIST Driven Power Conscious Post-Manufacture Tuning of Wireless Transceiver Systems Using Hardware-Iterated Gradient Search. Asian Test Symposium 2009: 243-248 - [c3]Shyam Kumar Devarakond, Shreyas Sen, Abhijit Chatterjee:
BIST assisted wideband digital compensation for MB-UWB transmitters. DDECS 2009: 84-89 - [c2]Abhijit Chatterjee, Donghoon Han, Vishwanath Natarajan, Shyam Kumar Devarakond, Shreyas Sen, Hyun Woo Choi, Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhilash Goyal, Deuk Lee, Madhavan Swaminathan:
Iterative built-in testing and tuning of mixed-signal/RF systems. ICCD 2009: 319-326 - [c1]Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee:
Low cost AM/AM and AM/PM distortion measurement using distortion-to-amplitude transformations. ITC 2009: 1-10
Coauthor Index
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