"Concurrent Device/Specification Cause-Effect Monitoring for Yield ..."

Shyam Kumar Devarakond et al. (2012)

> Home

Details and statistics

DOI: 10.1109/MDT.2011.2179348

access: closed

type: Journal Article

metadata version: 2020-05-17

- view
  authority control:
- export record
  dblp key:
  - journals/dt/DevarakondSBC12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/dt/DevarakondSBC12
Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee:
Concurrent Device/Specification Cause-Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures. IEEE Des. Test Comput. 29(1): 48-58 (2012)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.