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"Adverse Event extraction from Structured Product Labels using the ..."

Abhishek Pandey et al. (2019)

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DOI: 10.1177/1460458217749883

access: closed

type: Journal Article

metadata version: 2023-09-30

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  - https://dblp.org/rec/journals/hij/PandeyKFDLWFB19
Abhishek Pandey, Kory Kreimeyer, Matthew Foster, Oanh Dang, Thomas Ly, Wei Wang, Richard Forshee, Taxiarchis Botsis:
Adverse Event extraction from Structured Product Labels using the Event-based Text-mining of Health Electronic Records (ETHER) system. Health Informatics J. 25(4) (2019)

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