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"Utilising the normal distribution of the write noise margin to easily ..."

Hiroshi Makino et al. (2012)

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DOI: 10.1049/IET-CDS.2012.0090

access: closed

type: Journal Article

metadata version: 2020-09-10

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  - journals/iet-cds/MakinoNSMMYIM12
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  - https://dblp.org/rec/journals/iet-cds/MakinoNSMMYIM12
Hiroshi Makino, Shunji Nakata, Hirotsugu Suzuki, Shin'ichiro Mutoh, Masayuki Miyama, Tsutomu Yoshimura, Shuhei Iwade, Yoshio Matsuda:
Utilising the normal distribution of the write noise margin to easily predict the SRAM write yield. IET Circuits Devices Syst. 6(4): 260-270 (2012)

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