"Evaluation of delay-time degradation of low-voltage BiCMOS based on a ..."

Minoru Fujishima, Kunihiro Asada, Takuo Sugano (1991)

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DOI: 10.1109/4.65706

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type: Journal Article

metadata version: 2025-03-03

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Minoru Fujishima, Kunihiro Asada, Takuo Sugano:
Evaluation of delay-time degradation of low-voltage BiCMOS based on a novel analytical delay-time modeling. IEEE J. Solid State Circuits 26(1): 25-31 (1991)

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