"Comments on 'A compact thermal noise model for the investigation of ..."

Jerzy F. Kolodziejski, Ludwik Spiralski (1990)

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DOI: 10.1109/4.58304

access: closed

type: Journal Article

metadata version: 2025-01-23

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Jerzy F. Kolodziejski, Ludwik Spiralski:
Comments on 'A compact thermal noise model for the investigation of soft error rates in MOS VLSI digital circuits'. IEEE J. Solid State Circuits 25(4): 1039 (1990)

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