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"A physical approach on SCOBIC investigation in VLSI."

Thomas Beauchêne et al. (2003)

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DOI: 10.1016/S0026-2714(02)00282-2

access: closed

type: Journal Article

metadata version: 2021-01-20

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  - journals/mr/BeaucheneLBPPFD03
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  - https://dblp.org/rec/journals/mr/BeaucheneLBPPFD03
Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto:
A physical approach on SCOBIC investigation in VLSI. Microelectron. Reliab. 43(1): 173-177 (2003)

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