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"Characterization of ESD induced defects using Photovoltaic Laser ..."

Thomas Beauchêne et al. (2003)

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DOI: 10.1016/S0026-2714(03)00277-4

access: closed

type: Journal Article

metadata version: 2021-01-20

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  - https://dblp.org/rec/journals/mr/BeaucheneTLPF03
Thomas Beauchêne, David Trémouilles, Dean Lewis, Philippe Perdu, Pascal Fouillat:
Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS). Microelectron. Reliab. 43(9-11): 1577-1582 (2003)

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