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"Impact of silicon nitride CESL on NLDEMOS transistor reliability."
Gaelle Beylier et al. (2008)
- Gaelle Beylier, Sylvie Bruyère, Darcy Benoit, Gérard Ghibaudo:
Impact of silicon nitride CESL on NLDEMOS transistor reliability. Microelectron. Reliab. 48(8-9): 1539-1543 (2008)
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